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Articles about 'Voltage Contrast Inspection'

Spring Issue 2003

07 April, 2003 Spring 2003 Volume 5, Issue 1

Preview the interactive digital publishing of YMS Magazine to simulate the experience of reading a print publication online.

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Summer Issue 2010

23 August, 2010

SPOTLIGHT: ASMC 2010

The 21st annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2010) was held July 11-13 at the San Francisco Marriott Marquis, in conjunction with this year’s SEMICON West and Intersolar North America conferences. The conference began with an interactive poster session and reception sponsored by KLA-Tencor on Sunday, July 11. 21 papers were featured, authored by engineers from companies and universities from around the world. The rest of this year’s ASMC, held over July 12-13, consisted of 11 additional sessions presenting 49 technical papers, as well as three keynote speeches. The three keynotes, by Matt Nowak, Senior Director of Engineering, VLSI Technology Group, CDMA Technology Division, Qualcomm; Kalin Kuhn, Intel Fellow, Advanced Devices Technology, Intel Corporation; and Bill McClean, President, IC Insights. KLA-TENCOR partnered with IBM, GLOBALFOUNDRIES, imec and Timbre Technologies to present 10 technical papers at the conference.

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Winter Issue 2002

03 December, 2002 Winter 2002 Volume 4, Issue 1

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